Designed to be the most precise and flexible semi-automated test solution for wafers and substrates up to 200 mm
Flexibility: Ideal for FA, RF, opto-engineering and MEMS tests, Large number of accessories available, e.g., laser cutters, probe card holders, dark box, emission microscopes
Mechanics: Higly stable, Best position accuracy avilable on the market
Ease of use: Unique and easy to operate Velox probe station control software
Double-side option: Front or backside instrumentation, e.g.: Integrating Sphere, Fiber setup, Pressure Module