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Wafer testing is the testing of individual integrated circuits at wafer level. By means of probe stations, extensive testing is done for functionality, characterization, any defective process influences or process deviations, and certain life cycle tests can also be done. The probe stations can be equipped with probe cards and/or positioners to connect the measuring points to the measuring instrumentation. In order to achieve a higher efficiency, the probe stations can also be equipped with an automatic loader, pre-aligner, Id reader, and a Foup load dock in order to be able to test 25 wafers in one batch. Testing can be done in different ways, the most common being Wafer Final Test (WFT), Electronic Die Sort (EDS) and Circuit Probe (CP). With FormFactor, Microtron has a high-quality solution for all your wafer testing. Please contact our experts for more information.
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Metrology
With Formfactor as a partner, we have a wide range of essential test and measurement technologies for the full IC lifecycle, from inspection and metrology, characterization, modeling, reliability and design debug, to qualification and production testing. Contact Microtron for a complete overview.
Probe Cards
A probe card is an essential interface for performing wafer tests. It provides the connection with the integrated circuits on a wafer to the ATE (Automated Test Equipment) to test their electrical parameters and performance before they are finished and shipped. Microtron has an extensive portfolio of high-quality probe cards.
Probe Stations
With Formfactor as a partner, we have a broad range of probe stations for you in our range. From manual to fully automatic clusters. This includes probe stations that are suitable for different applications such as DC, RF, High voltage, Silicon Photonics or even Vacuum or Cryosystems. These probe stations are available with various accessories such as (digital) microscopes, thermal…
Probes
FormFactor has a very broad range of (analytical) probes, optical probes or multi-contact probes. Suitable for characterizing your wafer, packaged device or board level devices. They are all designed to meet the challenge of a wide range of measurement environments, whether it is RF from 40GHz to 1.1 THz, SiPh light probe, or simply a multi-contact probe. Microtron experts are happy…
Software
FormFactor provides various software to achieve faster and better test results. The software controls the alignment and loading of probes and ensures the collection and analysis of test data so that the time you spend performing measurements is optimized.This is why you choose Microtron!
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